Professor Balandin chairs the 3rd Inten'l SPIE Conference on Noise in Devices and Circuits . The information about this conference can be found at the SPIE Conference Web-Site. This international conference focuses on noise and fluctuations in devices and circuits. It covers both experimental and theoretical aspects of noise and fluctuations, experimental techniques, modeling and applied noise reduction issues. The co-chairs of this conference are Prof. François Danneville, Institut d'Electronique de Microélectronique et de Nanotechnologie (France), Prof. M. Jamal Deen, McMaster University (Canada), and Prof. Daniel Fleetwood, Vanderbilt University (USA).

UCR official press release on the even can be found HERE.